STDF Extractor 2.98

STDF Extractor is a utility for turning semiconductor Standard Test Data Format (STDF) files into clean, analysis-ready datasets. Designed for test, yield, and product engineering teams, it converts raw MIR/PIR/PRR/PTR/MPR/FTR records into structured tables you can load into spreadsheets, databases, or data science tools.

Key capabilities:

• Fast parsing of large STDF files with streaming support for multi-GB datasets
• Selective extraction and filtering by lot, wafer, part, head/site, test number, and time range
• Export to CSV, JSON, Parquet, and common SQL targets (e.g., SQLite, PostgreSQL)
• Preservation of metadata and mapping of bins, test numbers, and limits to readable labels
• Automatic unit handling and limit capture for guardband and out-of-spec analysis
• Error-tolerant parsing with detailed logs and record-level validation
• Command-line and simple GUI modes for batch automation and ad hoc use
• Cross-platform support for Windows, macOS, and Linux
• Extensible schema and user-defined field selection
• Works offline so test data stays within your environment

Use STDF Extractor to accelerate yield analysis, limit audits, correlation studies, and RMA investigations by getting from STDF to insights in minutes instead of hours.

STDF Extractor is developed by Freescale Semiconductor, Inc.. The most popular versions of this product among our users are: 3.0 beta, 4.0, 4.1, 5.0 beta and 5.0. The names of program executable files are stdfExtract.exe, stdfextractor64.exe.